Thin film analysis by X-ray scattering / Mario Birkholz ; contrib. Paul F. Fewster, Christoph Genzel
Publication: Weinheim : WILEY-VCH, 2006Description: XXII, 356 p. : il. ; 25 cm.ISBN: 3-527-31052-5.Subject - Topical Name: Física da matéria condensada | Raio-x | Difracção| Item type | Current location | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|
| Livro | Biblioteca do ISEL | BIR. 538.9 (Browse shelf) | Available | 1020194 |
Total holds: 0
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